Search results for "Electrostatic force microscope"
showing 6 items of 6 documents
Casimir-Polder force density between an atom and a conducting wall
2007
In this paper we calculate the Casimir-Polder force density (force per unit area acting on the elements of the surface) on a metallic plate placed in front of a neutral atom. To obtain the force density we use the quantum operator associated to the electromagnetic stress tensor. We explicitly show that the integral of this force density over the plate reproduces the total force acting on the plate. This result shows that, although the force is obtained as a sum of surface element-atom contributions, the stress-tensor method includes also nonadditive components of Casimir-Polder forces in the evaluation of the force acting on a macroscopic object.
Towards the origin of the shear force in near-field microscopy
2001
The shear force from a gold or a graphite sample acting on an approaching near-field optical probe is studied in detail. The adiabatic and dissipative contributions to the force are clearly distinguished by monitoring the amplitude as well as the phase of the tip vibration when the tip approaches the surfaces. We also take into account that not only the damping and the resonance frequency but also the mass of the system changes when the tip approaches the surface. The relative strength of the contributions to the force varies differently but characteristically with the distance of the two samples, starting at a much larger distance in the case of graphite. The adiabatic contribution is lar…
Preliminary results on the electrostatic double-layer force between two surfaces with high surface potentials
1998
Abstract The aim of this study is to measure interaction forces between surfaces with high electric potentials in aqueous electrolyte solutions. Therefore the force between a gold sample and a gold sphere attached to the end of an atomic force microscope cantilever was measured. Gold sample and sphere were electrically connected and served as the working electrode. A potential was applied via a platinized platinum electrode. Experimental results are compared to forces approximated with the Poisson-Boltzmann theory.
Measuring electrostatic double-layer forces on HOPG at high surface potentials
1999
Abstract The aim of this study was to investigate surface forces in aqueous electrolyte solutions between surfaces with high electric potentials. Therefore the force between a surface of highly oriented pyrolytic graphite (HOPG) and a silicon nitride tip of an atomic force microscope was measured. Various electric potentials by a counter electrode were applied to the HOPG, which served as working electrode. As predicted by the Poisson–Boltzmann theory the electrostatic double-layer force changed only in a narrow potential range of ≈300 mV. At high negative sample potentials, where the negatively charged tip was repelled from the sample, the force saturated. At positive potentials an attract…
Single-molecule switching with non-contact atomic force microscopy
2011
We report upon controlled switching of a single 3,4,9,10-perylene tetracarboxylic diimide derivative molecule on a rutile TiO(2)(110) surface using a non-contact atomic force microscope at room temperature. After submonolayer deposition, the molecules adsorb tilted on the bridging oxygen row. Individual molecules can be manipulated by the atomic force microscope tip in a well-controlled manner. The molecules are switched from one side of the row to the other using a simple approach, taking benefit of the sample tilt and the topography of the titania substrate. From density functional theory investigations we obtain the adsorption energies of different positions of the molecule. These adsorp…
Lateral force microscopy of multiwalled carbon nanotubes
2009
Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube. We found that, qualitatively, both magnitude and sign of the lateral forces to the AFM tip were independent of scan direction and can be concluded to arise from the tip slipping on the round edges of the nanotube. The dependence on the normal force applied to the tip and on the ratio between nanotub…